HP Spectroscopy, a German company founded in 2012, is committed to customizing the best solutions for customers in the global scientific and industrial fields. It is a global supplier and leading developer of scientific instruments. The product line includes XAS systems, XUV/VUV/X-ray spectrometers, beamline products, and more. The main team is composed of experts in X-ray, spectroscopy, grating design, plasma physics, beamline and other fields. And maintain close cooperation with scientists from leading research institutions around the world, pay attention to cutting-edge technologies, and maintain product iteration and innovation.

　　Product Introduction

Flat field and vertical incidence spectrometer

Exclusive slit free design to ensure maximum efficiency

Wavelength range 30~250 nm

The most compact spectrometer in the same category

　　Modular and complete design

EasyLIGHT XUV provides broadband spectral measurements with unprecedented efficiency. The slit free design directly images the radiation source, eliminating the cumbersome entrance slit. The spectral range of 30 to 250nm conveniently covers many applications in HHG and plasma diagnostics. Compared to grazing incidence spectrometers, the vertical incidence design of easyLight XUV provides simple installation and alignment. Modular design matches various experimental geometries and configurations. EasyLIGHT has an integrated slit holder and closed-loop electric grating positioning function.

　Detector optional types:

VUV CCD camera has the highest resolution and dynamic range

MCP and CMOS detectors have the widest wavelength coverage range, gate control, and enhanced detector capabilities

Customized design based on easyLight spectrometer can be discussed

　　No slit design

HPS's proprietary spectrometer design can be used for direct source imaging. Therefore, there is no need for narrow entrance slits and the incident light can be collected to the maximum extent possible. Compared to traditional spectrometer architectures, the light intensity reaching the detector will be 20 times higher. This structure also greatly improves the stability of daily operations.

　　Technical parameters:

　　application

High-order harmonic light source

Aces Science

Interaction between intense laser and matter

Laser and discharge generate plasma sources

Characterization of synchrotron radiation beam

Free electron laser